Samples selected for SEM/EDS analysis are first cleaned using toluene
and methanol to remove hydrocarbon residue, and then dried in a vacuum
oven. The samples are broken to expose fresh interior surfaces.
Samples are then cemented to an aluminum stub with epoxy. Carbon
paint is used to cover the base of the sample and the epoxy to improve
conduction and reduce charging effects in the SEM. Samples are sputter
coated with platinum for 5 minutes.
SEM/EDS analyses are performed utilizing a JEOL JSM-35C scanning electron
microscope (15 kV) with attached Kevex energy dispersive spectrometer.
Secondary electron image photomicrographs are recorded with a digital camera.
Images are digitally stored in tiff format. EDS spectra are acquired
using count times of 1-2 minutes.
